TY  - RPRT
TI  - Nature of traps responsible for failure of MOS devices
AU  - V. A. Gritsenko
AU  - P. M. Lenahan
AU  - Yu. N. Morokov
AU  - Yu. N. Novikov
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0011241
ID  - cond-mat/0011241
ER  -