TY  - RPRT
TI  - Role of defects in the electronic properties of amorphous/crystalline Si interface
AU  - Maria Peressi
AU  - Luciano Colombo
AU  - Stefano de Gironcoli
PY  - 2001
DO  - 10.1103/physrevb.64.193303
UR  - https://arxiv.org/abs/cond-mat/0102399
ID  - cond-mat/0102399
ER  -