@misc{indiciaea122da642b11,
  title = {Quantitative Comparison between AES and SIMS Depth Profiles of a Double Layer Structure of AlAs in GaAs Using the MRI-model},
  author = {S. Hofmann and A. Rar and D. W. Moon and K. Yoshihara},
  year = {2001},
  url = {https://arxiv.org/abs/cond-mat/0104434},
  note = {Source identifier: cond-mat/0104434}
}