TY  - RPRT
TI  - Quantitative Comparison between AES and SIMS Depth Profiles of a Double Layer Structure of AlAs in GaAs Using the MRI-model
AU  - S. Hofmann
AU  - A. Rar
AU  - D. W. Moon
AU  - K. Yoshihara
PY  - 2001
UR  - https://arxiv.org/abs/cond-mat/0104434
ID  - cond-mat/0104434
ER  -