TY  - RPRT
TI  - The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors
AU  - H. Scherer
AU  - Th. Weimann
AU  - A. B. Zorin
AU  - J. Niemeyer
PY  - 2001
DO  - 10.1063/1.1389077
UR  - https://arxiv.org/abs/cond-mat/0105455
ID  - cond-mat/0105455
ER  -