TY  - RPRT
TI  - Thickness dependence of the ground-state properties in thin films of the heavy-fermion compound CeCu_6
AU  - D. Groten
AU  - G. J. C. van Baarle
AU  - J. Aarts
AU  - G. J. Nieuwenhuys
AU  - J. A. Mydosh
PY  - 2001
UR  - https://arxiv.org/abs/cond-mat/0107049
ID  - cond-mat/0107049
ER  -