TY  - RPRT
TI  - Point defects in models of amorphous silicon and their role in structural relaxation
AU  - Cristiano L. Dias
AU  - Laurent J. Lewis
AU  - S. Roorda
PY  - 2001
UR  - https://arxiv.org/abs/cond-mat/0108141
ID  - cond-mat/0108141
ER  -