TY  - RPRT
TI  - Enhanced tunneling across nanometer-scale metal-semiconductor interfaces
AU  - G. D. J. Smit
AU  - S. Rogge
AU  - T. M. Klapwijk
PY  - 2002
DO  - 10.1063/1.1467980
UR  - https://arxiv.org/abs/cond-mat/0110256
ID  - cond-mat/0110256
ER  -