TY  - RPRT
TI  - Peak effect and its evolution with defect structure in YBa2Cu3O7-d thin films at microwave frequencies
AU  - Tamalika Banerjee
AU  - D. Kanjilal
AU  - R. Pinto
PY  - 2001
DO  - 10.1103/physrevb.65.174521
UR  - https://arxiv.org/abs/cond-mat/0110459
ID  - cond-mat/0110459
ER  -