TY  - RPRT
TI  - Monte Carlo simulation of electromigration phenomena in metallic lines
AU  - C. Pennetta
AU  - L. Reggiani
AU  - E. Alfinito
PY  - 2001
UR  - https://arxiv.org/abs/cond-mat/0110647
ID  - cond-mat/0110647
ER  -