TY  - RPRT
TI  - Stability of Ge-related point defects and complexes in Ge-doped SiO_2
AU  - C. M. Carbonaro
AU  - V. Fiorentini
AU  - F. Bernardini
PY  - 2002
DO  - 10.1103/physrevb.66.233201
UR  - https://arxiv.org/abs/cond-mat/0202497
ID  - cond-mat/0202497
ER  -