TY  - RPRT
TI  - Universal Behavior of the Resistance Noise across the Metal-Insulator Transition in Silicon Inversion Layers
AU  - J. Jaroszynski
AU  - Dragana Popovic
AU  - T. M. Klapwijk
PY  - 2002
DO  - 10.1103/physrevlett.89.276401
UR  - https://arxiv.org/abs/cond-mat/0205226
ID  - cond-mat/0205226
ER  -