TY  - RPRT
TI  - Defects in ultrathin copper nanowires
AU  - Jeong Won Kang
AU  - Jae Jeong Seo
AU  - Ki Ryang Byun
AU  - Ho Jung Hwang
PY  - 2002
DO  - 10.1103/physrevb.66.125405
UR  - https://arxiv.org/abs/cond-mat/0207119
ID  - cond-mat/0207119
ER  -