@misc{indiciae7e4ace4a7b92,
  title = {First-principles theoretical evaluation of crystalline zirconia and hafnia as gate oxides for Si microelectronics},
  author = {V. Fiorentini and G. Gulleri},
  year = {2002},
  doi = {10.1103/physrevlett.89.266101},
  url = {https://arxiv.org/abs/cond-mat/0208149},
  note = {Source identifier: cond-mat/0208149}
}