TY  - RPRT
TI  - Resistance of multilayers with long length scale interfacial roughness
AU  - Jason Alicea
AU  - Selman Hershfield
PY  - 2002
DO  - 10.1063/1.1555799
UR  - https://arxiv.org/abs/cond-mat/0208251
ID  - cond-mat/0208251
ER  -