TY  - RPRT
TI  - Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide
AU  - S. V. Vyshenski
AU  - U. Zeitler
AU  - R. J. Haug
PY  - 2002
DO  - 10.1134/1.1538291
UR  - https://arxiv.org/abs/cond-mat/0210104
ID  - cond-mat/0210104
ER  -