@misc{indiciaee01179b3c076,
  title = {Measuring Lateral Magnetic Structure in Thin Films Using Polarized Neutron Reflectometry},
  author = {W. -T. Lee and S. G. E. te Velthuis and G. P. Felcher and F. Klose and T. Gredig and D. Dahlberg and B. V. Toperverg},
  year = {2002},
  doi = {10.1016/s0921-4526(03)00195-9},
  url = {https://arxiv.org/abs/cond-mat/0210124},
  note = {Source identifier: cond-mat/0210124}
}