TY  - RPRT
TI  - Noise in the Single Electron Transistor and its back action during measurement
AU  - G. Johansson
AU  - P. Delsing
AU  - K. Bladh
AU  - D. Gunnarsson
AU  - T. Duty
AU  - A. Käck
AU  - G. Wendin
AU  - A. Aassime
PY  - 2002
UR  - https://arxiv.org/abs/cond-mat/0210163
ID  - cond-mat/0210163
ER  -