TY  - RPRT
TI  - Frustration of the interlayer coupling by mobile holes in La2-xSrxCuO4 (x<0.02)
AU  - M. Hucker
AU  - H. -H. Klauss
AU  - B. Buchner
PY  - 2002
DO  - 10.1103/physrevb.70.220507
UR  - https://arxiv.org/abs/cond-mat/0210357
ID  - cond-mat/0210357
ER  -