TY  - RPRT
TI  - Tip-gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices
AU  - Sergei V. Kalinin
AU  - Dawn A. Bonnell
AU  - Marcus Freitag
AU  - A. T. Johnson
PY  - 2002
DO  - 10.1063/1.1531833
UR  - https://arxiv.org/abs/cond-mat/0210474
ID  - cond-mat/0210474
ER  -