TY  - RPRT
TI  - Preparation and structural properties of thin films and multilayers of the Heusler compounds Cu2MnAl, Co2MnSn, Co2MnSi and Co2MnGe
AU  - U. Geiersbach
AU  - A. Bergmann
AU  - K. Westerholt
PY  - 2002
DO  - 10.1016/s0040-6090(02)01091-x
UR  - https://arxiv.org/abs/cond-mat/0211271
ID  - cond-mat/0211271
ER  -