TY  - RPRT
TI  - Nanocrystal Formation in Si Implanted Thin SiO2 Layers under the Influence of an Absorbing Interface
AU  - T. Mueller
AU  - K. -H. Heinig
AU  - W. Moeller
PY  - 2002
UR  - https://arxiv.org/abs/cond-mat/0212285
ID  - cond-mat/0212285
ER  -