TY  - RPRT
TI  - Thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid physical-chemical vapor deposition
AU  - A. V. Pogrebnyakov
AU  - J. M. Redwing
AU  - J. E. Jones
AU  - X. X. Xi
AU  - S. Y. Xu
AU  - Q. Li
AU  - V. Vaithyanathan
AU  - D. G. Schlom
PY  - 2003
DO  - 10.1063/1.1583852
UR  - https://arxiv.org/abs/cond-mat/0304164
ID  - cond-mat/0304164
ER  -