TY  - RPRT
TI  - Elasticity-driven Nanoscale Texturing in Complex Electronic Materials
AU  - A. R. Bishop
AU  - T. Lookman
AU  - A. Saxena
AU  - S. R. Shenoy
PY  - 2003
DO  - 10.1209/epl/i2003-00522-9
UR  - https://arxiv.org/abs/cond-mat/0304198
ID  - cond-mat/0304198
ER  -