TY  - RPRT
TI  - Nanolithography based on real-time electrically-controlled indentation with an atomic force microscope for nanocontacts elaboration
AU  - K. Bouzehouane
AU  - S. Fusil
AU  - M. Bibes
AU  - J. Carrey
AU  - T. Blon
AU  - P. Seneor
AU  - V. Cros
AU  - L. Vila
PY  - 2003
DO  - 10.1021/nl034610j
UR  - https://arxiv.org/abs/cond-mat/0306068
ID  - cond-mat/0306068
ER  -