TY  - RPRT
TI  - The effect of electromechanical coupling on the strain in AlGaN/GaN heterojunction field effect transistors
AU  - B. Jogai
AU  - J. D. Albrecht
AU  - E. Pan
PY  - 2003
DO  - 10.1063/1.1603953
UR  - https://arxiv.org/abs/cond-mat/0306297
ID  - cond-mat/0306297
ER  -