TY  - RPRT
TI  - Measuring geometric phases of scattering states in nanoscale electronic devices
AU  - Huan-Qiang Zhou
AU  - Urban Lundin
AU  - Sam Young Cho
AU  - Ross H. McKenzie
PY  - 2003
DO  - 10.1103/physrevb.69.113308
UR  - https://arxiv.org/abs/cond-mat/0309096
ID  - cond-mat/0309096
ER  -