TY  - RPRT
TI  - Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape
AU  - I. Kuljanishvili
AU  - Subhasish Chakraborty
AU  - I . J. Maasilta
AU  - S. H. Tessmer
AU  - M. R. Melloch
PY  - 2004
UR  - https://arxiv.org/abs/cond-mat/0309667
ID  - cond-mat/0309667
ER  -