TY  - RPRT
TI  - Width distribution of contact lines on a disordered substrate
AU  - Sebastien Moulinet
AU  - Alberto Rosso
AU  - Werner Krauth
AU  - Etienne Rolley
PY  - 2003
DO  - 10.1103/physreve.69.035103
UR  - https://arxiv.org/abs/cond-mat/0310173
ID  - cond-mat/0310173
ER  -