TY  - RPRT
TI  - Measurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films
AU  - Wenhao Wu
AU  - E. Bielejec
PY  - 2005
UR  - https://arxiv.org/abs/cond-mat/0310190
ID  - cond-mat/0310190
ER  -