TY  - RPRT
TI  - Effect of discrete impurities on electron transport in ultra-short MOSFET using 3D Monte Carlo simulation
AU  - P. Dollfus
AU  - A. Bournel
AU  - S. Galdin
AU  - S. Barraud
AU  - P. Hesto
PY  - 2004
DO  - 10.1109/ted.2004.826844
UR  - https://arxiv.org/abs/cond-mat/0310718
ID  - cond-mat/0310718
ER  -