@misc{indiciae80db8fcce5c0,
  title = {Comparative study of defect energetics in HfO2 and SiO2},
  author = {W. L. Scopel and Antonio J. R. da Silva and W. Orellana and A. Fazzio},
  year = {2003},
  doi = {10.1063/1.1650874},
  url = {https://arxiv.org/abs/cond-mat/0310747},
  note = {Source identifier: cond-mat/0310747}
}