TY  - RPRT
TI  - Accumulation and depletion layer thicknesses in organic field effect transistors
AU  - Manabu Kiguchi
AU  - Manabu Nakayama
AU  - Kohei Fujiwara
AU  - Keiji Ueno
AU  - Toshihiro Shimada
AU  - Koichiro Saiki
PY  - 2003
DO  - 10.1143/jjap.42.l1408
UR  - https://arxiv.org/abs/cond-mat/0310756
ID  - cond-mat/0310756
ER  -