@misc{indiciaee97fa8628872,
  title = {A Biased Resistor Network Model for Electromigration Failure and Related Phenomena in Metallic Lines},
  author = {C. Pennetta and E. Alfinito and L. Reggiani and F. Fantini and I. DeMunari and A. Scorzoni},
  year = {2004},
  doi = {10.1103/physrevb.70.174305},
  url = {https://arxiv.org/abs/cond-mat/0402557},
  note = {Source identifier: cond-mat/0402557}
}