TY  - RPRT
TI  - A Biased Resistor Network Model for Electromigration Failure and Related Phenomena in Metallic Lines
AU  - C. Pennetta
AU  - E. Alfinito
AU  - L. Reggiani
AU  - F. Fantini
AU  - I. DeMunari
AU  - A. Scorzoni
PY  - 2004
DO  - 10.1103/physrevb.70.174305
UR  - https://arxiv.org/abs/cond-mat/0402557
ID  - cond-mat/0402557
ER  -