TY  - RPRT
TI  - Charge dynamics and Kondo effect in single electron traps in field effect transistors
AU  - I. Martin
AU  - D. Mozyrsky
PY  - 2004
DO  - 10.1103/physrevb.71.165115
UR  - https://arxiv.org/abs/cond-mat/0403491
ID  - cond-mat/0403491
ER  -