@misc{indiciae1517676551c9,
  title = {Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors},
  author = {A. F. Stassen and R. W. I. de Boer and N. N. Iosad and A. F. Morpurgo},
  year = {2004},
  doi = {10.1063/1.1812368},
  url = {https://arxiv.org/abs/cond-mat/0407293},
  note = {Source identifier: cond-mat/0407293}
}