@misc{indiciae2a19cf5c5aee,
  title = {Weak Localization Thickness Measurements of Si:P Delta-Layers},
  author = {D. F. Sullivan and B. E. Kane and P. E. Thompson},
  year = {2004},
  doi = {10.1063/1.1842366},
  url = {https://arxiv.org/abs/cond-mat/0408193},
  note = {Source identifier: cond-mat/0408193}
}