TY  - RPRT
TI  - Weak Localization Thickness Measurements of Si:P Delta-Layers
AU  - D. F. Sullivan
AU  - B. E. Kane
AU  - P. E. Thompson
PY  - 2004
DO  - 10.1063/1.1842366
UR  - https://arxiv.org/abs/cond-mat/0408193
ID  - cond-mat/0408193
ER  -