@misc{indiciaebca6b59bd3d1,
  title = {Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors},
  author = {R. W. I. de Boer and N. N. Iosad and A. F. Stassen and T. M. Klapwijk and A. F. Morpurgo},
  year = {2004},
  doi = {10.1063/1.1852089},
  url = {https://arxiv.org/abs/cond-mat/0408514},
  note = {Source identifier: cond-mat/0408514}
}