TY  - RPRT
TI  - Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors
AU  - R. W. I. de Boer
AU  - N. N. Iosad
AU  - A. F. Stassen
AU  - T. M. Klapwijk
AU  - A. F. Morpurgo
PY  - 2004
DO  - 10.1063/1.1852089
UR  - https://arxiv.org/abs/cond-mat/0408514
ID  - cond-mat/0408514
ER  -