TY  - RPRT
TI  - A Two-Region Diffusion Model for Current-Induced Instabilities of Step Patterns on Vicinal Si(111) Surfaces
AU  - T. Zhao
AU  - J. D. Weeks
PY  - 2004
DO  - 10.1016/j.susc.2005.02.015
UR  - https://arxiv.org/abs/cond-mat/0408548
ID  - cond-mat/0408548
ER  -