TY  - RPRT
TI  - Direct measurement of the electron-phonon relaxation rate in thin copper films
AU  - L. J. Taskinen
AU  - J. M. Kivioja
AU  - J. T. Karvonen
AU  - I. J. Maasilta
PY  - 2004
DO  - 10.1002/pssc.200405307
UR  - https://arxiv.org/abs/cond-mat/0410283
ID  - cond-mat/0410283
ER  -