@misc{indiciaef1343bd184f0,
  title = {X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films},
  author = {V. M. Kaganer and O. Brandt and A. Trampert and K. H. Ploog},
  year = {2004},
  doi = {10.1103/physrevb.72.045423},
  url = {https://arxiv.org/abs/cond-mat/0410510},
  note = {Source identifier: cond-mat/0410510}
}