TY  - RPRT
TI  - X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films
AU  - V. M. Kaganer
AU  - O. Brandt
AU  - A. Trampert
AU  - K. H. Ploog
PY  - 2004
DO  - 10.1103/physrevb.72.045423
UR  - https://arxiv.org/abs/cond-mat/0410510
ID  - cond-mat/0410510
ER  -