@misc{indiciaece099b6d84bb,
  title = {Kondo Effect in Electromigrated Gold Break Junctions},
  author = {A. A. Houck and J. Labaziewicz and E. K. Chan and J. A. Folk and I. L. Chuang},
  year = {2004},
  doi = {10.1021/nl050799i},
  url = {https://arxiv.org/abs/cond-mat/0410752},
  note = {Source identifier: cond-mat/0410752}
}