TY  - RPRT
TI  - Kondo Effect in Electromigrated Gold Break Junctions
AU  - A. A. Houck
AU  - J. Labaziewicz
AU  - E. K. Chan
AU  - J. A. Folk
AU  - I. L. Chuang
PY  - 2004
DO  - 10.1021/nl050799i
UR  - https://arxiv.org/abs/cond-mat/0410752
ID  - cond-mat/0410752
ER  -