TY  - RPRT
TI  - Impact of layer defects in ferroelectric thin films
AU  - J. M. Wesselinowa
AU  - S. Trimper
AU  - K. Zabrocki
PY  - 2004
DO  - 10.1088/0953-8984/17/29/010
UR  - https://arxiv.org/abs/cond-mat/0411099
ID  - cond-mat/0411099
ER  -