TY  - RPRT
TI  - On the high accuracy lattice-parameters determination by n-beam diffraction: Theory and application to the InAs quantum dots grown over GaAs(001) substrate system
AU  - L. H. Avanci
AU  - A. A. Quivy
AU  - S. L. Morelhao
AU  - C. M. R. Remedios
PY  - 2004
UR  - https://arxiv.org/abs/cond-mat/0411508
ID  - cond-mat/0411508
ER  -