TY  - RPRT
TI  - A Quantum Mechanical Approach for the Simulation of Si/SiO2 Interface Roughness Scattering in Silicon Nanowire Transistors
AU  - Jing Wang
AU  - Eric Polizzi
AU  - Avik Ghosh
AU  - Supriyo Datta
AU  - Mark Lundstrom
PY  - 2004
UR  - https://arxiv.org/abs/cond-mat/0412111
ID  - cond-mat/0412111
ER  -